Introduction to Boundary-Scan, 19 September 10:30 (CEST)

General presentation of Boundary-Scan technology for electronic boards testing and in circuit programming.

Design for Test, 20 September 10:30 (CEST)

General notes how to design electronics to allow automatic testing using Boundary-Scan method.

JFT in-depth, 21 September 10:30 (CEST)

Presentation of JTAG Functonal Test software for automatic non-boundary-scan cluster testing based on descripted in Phyton language inputs’ drive values and outputs analyzes.