JT 5705/FXT is a highly compact (10cm x10cm) multifunction USB-powered instrument in its own right. It offers two full JTAG TAPs (Test Access Ports) and 64 IO channels with a combination of Digital, Analog and Frequency measurement capabilities. The matching JT 2702/xx range of carrier boards have been designed to allow seamless integration of this powerful capability into an array of popular bench fixtures ATE.
The already impressive specification of the JT 5705/FXT is enhanced by allowing two units to be placed onto a single carrier doubling the channel and TAP port count, what’s more additional multiplexing circuitry on the carriers increases the effective channel count event further.
Advanced users can also take advantage of the FPGA technology used by the JT 5705/FXT to create custom applications, controlled through JTAG’s unique CoreCommander FPGA software.
Specification JT 5705/FXT:
- 2 Test Access Ports (TAPs)
- TCK up to 15 MHz
- 64 I/O channels
- 8 Analog Input or Output channels (taken from above)
- Generated value has an accuracy of +/- 0.45%
- Measured value has an accuracy of +/- (0.4% + 100mV)
- Frequency measurements range 0 - 200 MHz
- Pulse width counter range 4 - 8192 ns
- Frequency generator range 0 - 62,5 MHz
Specification JT2702/MG:
- 2 sites for JT5705/FXT
- Signal multiplexers
- Designed for MG products fixture system
Specification JT2702/IG:
- 2 sites for JT5705/FXT
- Signal multiplexers
- Designed for Ingun products fixture system
Specification JT2702/BO:
- 1 site for JT5705/FXT
- Generic solution for all fixture systems
JT5705/RMI (Rack Mountable Instrument) offers high performance JTAG TAP controller with digital and analog I/O in compact 1U by 19" rackmount package.
JT5705/RMI has modular construction based on JT5705/FXT boards. Basic configuration with one JT5705/FXT features 1 TAP and 64 I/O channels. It can be expanded with maximum 3 more JT5705/FXT modules up to 4 TAPs and 256 IOs. These multiplied TAP’s can be used for targets that have multiple boundary-scan chains or for four identical single chain targets being tested and programmed in parallel.
JT5705/RMI allows testing and programming of medium to high complexity mixed signal designs and easy integration into functional ATE test-sets. Using it, you can measure power supplies, clock frequencies, pulse widths or test DACs and ADCs or even add measuring functions through use of our CoreCommander FPGA feature.
Specification:
- 1 - 4 Test Access Ports (TAPs)
- TCK up to 15 MHz
- 64 - 256 I/O channels
- 8 – 32 Analog Input or Output channels (taken from above)
- Generated value has an accuracy of +/- 0.45%
- Measured value has an accuracy of +/- (0.4% + 100mV)
- Analog range + 32.768V or ± 16.384V
- Frequency measurements up to 128 MHz
JT5705/USB offers a unique combination of JTAG TAP controller plus digital and analog I/O in compact desktop package.
JT5705/USB allows measuring power supplies, clock frequencies, pulse widths or test DACs and ADCs or even add measuring functions through use of our CoreCommander FPGA feature.
Specification:
- 2 Test Access Ports (TAPs)
- TCK up to 15 MHz
- 64 I/O channels
- 8 Analog Input or Output channels (taken from above)
- Generated value has an accuracy of +/- 0.45%
- Measured value has an accuracy of +/- (0.4% + 100mV)
- Frequency measurements range 0 - 200 MHz
- Pulse width counter range 4 - 8192 ns
- Frequency generator range 0 - 62,5 MHz
JT 3705/USB is a low-cost boundary-scan controller specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
JT 3705/USB is aimed at design engineer hardware debug, field service/repair and low volume production applications.
Specification:
- USB 1.1 and 2.0 compatible
- Powered from host PC
- 2 fully-compliant 1149.x TAPs
- TCK up to 6 MHz
- Programmable TAP voltage
- Small size: 57 x 79 x 16 mm
- Weight 49 g
JT 37x7 is a family of high-performance, 40 MHz, boundary-scan controllers. The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37x7 is available in different form factors and operating levels to suit customer’s specific environment.
- JT 3707 - Base-level for board testing, CPLD programming and flash programming of small data blocks
- JT 3717 - Board testing, CPLD programming, and programming of moderate-size flash memories in manufacturing and debugging
- JT 3727 - All applications including board testing and in-system programming of large flash memories and CPLDs in manufacturing and debugging
Specification:
- Test up to four boundary-scan chains simultaneously
- High-speed device programming
- Modular function adaptation
- Automatic TCK speed matching and programmability for optimum chain performance, up to 40 MHz continuous data rate
- Enhanced Throughput Technology™ (ETT) & gang operation delivers high volume production capability
- Independent control of four TAPs via JT 2147 QuadPOD™ system (included)
- Four voltage programmable 1149.x TAPs (1.0V to 3.6V)
- Compatible with JT 2149/MPV-0xx SCIL modules
JT 37x7/RMI (Rack Mountable Instrument) consists of a fully featured DataBlaster boundary-scan controller, equipped with four TAPs, plus 256 DIOS I/O channels, all packaged in a convenient 1U, 19-inch rack-mount unit. The RMI is ideal for use in test systems where demanding boundary-scan structural testing is combined with functional testing. High-speed, programmable test clock frequency (TCK) allows rapid application execution - important for flash memory programming. Where required, TAP pods can be replaced by JT 2149/MPV-0xx SCIL modules to provide custom functionality. With an additional JT 2149 Connector you can connect JT 2149/MPV TAP pods and SCIL modules to the JT 37x7/RMI - 19" rackmount controller with DIOS.
JT 37x7/RMI is ideally suited to fixed test systems where it can be built into a 19" rack alongside other (typically functional) test equipment. The combination of boundary-scan TAPs and DIOS (Digital I/O Scan) channels, plus the capability to support a wide range of device ISP (In-System Programming) applications make this a powerful digital tester/programmer to build into any functional tester.
JT 37x7/RMI is supported by a wide range of PIP (Production Integration Packages) drivers for National Instruments' LabView, TestStand, LabWindows, .NET etc.
Specification:
- All-in-one JTAG tester and programmer with synchronised DIOS channels
- Compact 1U by 19 inch unit supplied with rackmount adapter
- Four JTAG TAPs plus 256 IO channels
- Triple serial interface (USB, Firewire, Ethernet)
- Full 40MHz TCK DataBlaster performance
- 440 mm (19") width x 350 mm depth x 1U height
- Weight 2420 g