JT 2111/MPV is a 64 channel DIOS (Digital I/O Scan) module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Available with 96-pin DIN 41612 connectors and 20-pin 0.1" pitch IDC connectors. The 64 I/Os are grouped in four segments of 16 pins. Each segment can be bypassed in order to shorten the chain, thereby providing faster programming of flash devices. Multiple modules can be connected serially to increase the number of I/Os.
JT 2111/MPV can be used to extend fault coverage in benchtop or experimental test and board debug set-ups. Equally the unit can be enclosed with a production test fixture solution for volume testing.
JT 2111/MPV derives its power from an AC adaptor. The input power supply voltage is hardware or software selectable at 1.5V, 1.8V, 2.5V or 3.3V. If 3.3V is selected, the voltage input is 5V tolerant.
Specification JT 2111/MPV:
- 64 channels of digital I/O grouped in four 16 pins segments
- Configurable with SCIL functions
- Voltage selectable via rotary switch - 3.3V (5V tolerant), 2.5V, 1.8V, 1.5V
- Connector options 96-pin DIN or 20-pin IDC)
- 200mA supply voltage for accessories
- TCK rated to 25 MHz
- TAP-IN, TAP-OUT feature allows daisy-chaining with UUT or other DIOS
JT 2122/MPV DIOS (Digital I/O Scan) module provides bi-directional parallel-scan access to up to 128 I/Os. Brings in access to connectors and/or test points increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test. JT 2122/MPV DIOS
The TAP signals can be accessed via the 168 pin module connector or a separate 10-pin connector. A TAP-out can be used to daisy-chain to another DIOS module or to a scan chain on the target board.
JT 2122 DIMMs in conjunction with a JT2702 DIMM carrier to provide low-cost high channel count I/O within custom test fixtures. For example a generic test system comprising PSUs, JTAG Controller/Pod, DIOS modules, relays etc. can be built-in into a fixture-kit with 'Bed Of Nails' test adapters that may be built as 'personality modules' for each board type
Specification JT 2122/MPV:
- High-channel count DIOS system, 128 I/O lines - set-up in 8 blocks of 16 channels each -'bypassable'
- 45 MHz maximum TCK tolerant
- 1.8v to 5.0V PSU accepted; thresholds set by supply voltage - inputs 5V tolerant
- Compatible with JT 2702/DDC break-out board
- Low cost
- Small, low-profile package is ideal for mounting 'in-fixture'
JT 2124/F168 DIOS module is a highly configurable 128 channel DIMM DIOS in the familiar 168 pin format. It is similar to the JT 2122/MPV but has several enhanced features such as the ability to program I/O thresholds across a block of 16 channels and hot swap.
JT 2124 DIMM in conjunction with a JT2702 DIMM carrier provides low-cost high channel count I/O within custom test fixtures where different voltage logic is needed. For example a generic test system comprising PSUs, JTAG Controller/Pod, DIOS modules, relays etc. can be built-in into a fixture-kit with 'Bed Of Nails' test adapters that may be built as 'personality modules' for each board type.
Specification JT 2124/F168:
- High-channel count DIOS system, 128 independent I/O channels set-up in 8 blocks of 16 channels each -'bypassable'
- Maximum sustained TCK rate 40 MHz
- Power supply voltage range is 0.9-5.5V
- I/O input threshold adjustable from 0.0-4.1V, programmable per 16-pin segment
- I/O voltage output high is 1.5-3.6V, programmable per block of 16 pins
- Compatible with JT2702/DDC channel break-out module
- Improves fault coverage via connector and/or test-point access
- Increases fault coverage
- I/Os are configurable with pull-up or pull-down resistors
JT 2128 DIOS module increases fault coverage and improves the diagnostic resolution. The JT 2128 provides bi-directional parallel-scan access to up to 133 I/O channels grouped in three segments, each of which can be individually bypassed. The JT 2128 is designed for easy insertion in standard 168-pin DIMM sockets either on a target board, JT 2702/DDC break-out module or in a test fixture.
Use JT2128 DIMMs in conjunction with a JT2702 DIMM carrier to provide low-cost high channel count I/O within custom test fixtures. Units can also be user-programmed for specific logic functions and can be built-in into a fixture kit that provides 'Bed Of Nails' test interface.
Specification JT 2128 DIOS:
- Compatible with 168-pin DIMM sockets
- 128 channels of JTAG controlled DIO
- 'Customizable' functionality via Altera FPGA
- I/O voltage 'self-adaptive' within range of 1.8-3.3V
- TCK speed up to 30 MHz
JT 2127 STM (Socket Test Modules) family has been designed for manufacturing test of PCB DIMM sockets. They offer easy insertion in standard DIMM sockets on a target board and will test all active signals as well as the analog voltages on the individual power pins (such as Vdd, Vddq, Vref and Vddspd). JT 2127 STMs thereby provide a complete structural test of the DIMM sockets.
Specification JT 2127 STM:
- Tests connections to standard DIMM & SODIMM sockets
- Verifies power and ground voltages
- Measures DIMM socket power rails
- Works using DIOS technology, 128 channels of JTAG controlled DIO
- Wide range of pinouts and form factors
- Self-adaptive output voltage and input threshold levels to match target board over a range of 1.5V to 3.3V.
- Programmable functional test logic
- I/O voltage 'self-adaptive' within range of 1.8-3.3V
- TCK speed up to 30 MHz
JT 2702/PCI-Slot is a fixturing solution for the production testing of 32-bit and 64-bit PCI plug-in cards. Features sacrificial female sockets compatible with both 32-bit and 64-bit versions of the PCI bus. On the reverse side of the test adapter board, two sockets house regular JT 2122/MPV DIMM DIOS modules that provide the DIOS channels required to test the PCI bus signals.
During 32-bit bus testing 19 'spare' I/O channels are available at an IDC header that can be used for fault detection on other UUT connectors or test points. During 64-bit bus testing a total of 83 spare channels are available.
Specification JT 2702/PCI:
- B-S testing of PCI cards, 2 PCI bus slots for 32/64 bit boards
- Compatible with 3.3V and 5V PCI busses
- Test all connections of the PCI bus (32 and 64) including power and ground
- Up to 83 spare I/O channels for testing enhance fault coverage
- Provides test pins for power consumption monitoring
- Works using DIOS technology
- 2 JT 2122/MPV DIMM DIOS slots plus 2 power select DIMM slots
- Two separate PSU inputs
- Dimensions 200 x 200 x 40 mm
- Weight 475 g
JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
JT2702/DDC with one or two of JTAG Technologies DIMM/168 format DIOS units, the user can build either a 128 or 256 channel I/O system. Since the units can also be serially linked, a channel count in excess of 1000 IOs is easily achieved at a relatively low cost. Access to the channels is via eight standard 40-way 0.1" IDC connectors. Provides high density I/O conveniently accessed through standard IDC connectors. Used to increase fault coverage through connectors and/or test-points.
Specification JT 2702/DDC:
- Up to 256 channels per module
- Daisy-chain modules for higher channel count
- Supports up to 25MHz TCK test clock
- Compact size and high channel-count
- Autodetects installed DIMM DIOS'
- Autodetects additional 'daisy-chained' JT 2702/DDCs
- Standard adapter description included in ProVision
- 2 x DIMM-168 format slots for DIMM DIOS
- 8 x 40-Way latched IDC headers each supporting 32 I/O plus 8 signal grounds
- Standard 10-way IDC connectors for TAP-IN and TAP-OUT
- Dimensions 200 x 90 x 30 mm (no DIMMs fitted)
- Weight 175 g (no DIMMs fitted)
JT 2127 - Flex is a family of hardware adapters specifically designed for the testing of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What's more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain if you socket is soldered correctly.