JT 2147 QuadPOD comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via a one meter extension cable (included). The JT 2148 transceiver is available in standard or industrial variants. The industrial variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.
A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pods onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions..
Each POD provides active line terminations, maintaining the integrity of critical signals at the point of test. In addition to the TAP signals, the POD provides four programmable static I/O pins which can be used to precondition and monitor test and programming activities. I/O voltage levels of each POD can be independently programmed, and within each POD the TDI and TDO signal voltages can be set separately to match a variety of target chip technologies.
Specification JT 2147 QuadPOD:
- Signal conditioning pod for DataBlaster controllers
- Supports up to 40MHz TCK signals
- Detachable TAP pods also feature 4 user I/O pins
- Supports standard JT 2149 TAP pods or SCIL modules
- Available as standard desktop or industrial formats
- Includes convenient pod extender cables
- Backwards compatible with JT 3710 series controllers
- Four boundary-scan ports
- Enhanced signal integrity for high data rates
- Detachable PODs
- Programmable I/O voltages
JT 2149/MPV is a 32 channel multipurpose DIOS/TAP pod module that can be plugged into any spare JT 2148 QuadPOD transceiver slot. The DIOS channels of the JT 2149/MPV enable increases fault coverage through improved I/O test access and thus improved diagnostic resolution during boundary-scan testing. The unit is fully supported by JTAG Technologies' development tools. Additional DIOS modules can be serially connected if more parallel access points are required.
JT 2149/MPV is ideal for low channel count DIOS applications where space is limited. Can be reprogrammed with alternative (custom) SCIL (Scan Configurable Interface Logic) functions.
Specification JT 2149/MPV:
- IEEE Std. 1149.x TAP pod and DIOS (2 x 16 I/O lines) in one module.
- Provides I/O channels for increased fault coverage and improves 'diagnostic resolution'
- Features 4 static I/O pins in addition to 32 synchronized DIOS channels
- Plugs into JT 2148 QuadPOD transceiver slot
- Available also in extended version with additional 0.1" TAP connections
- 40MHz TCK frequency rated
- Retains full four TAP tester capability.
- Programmable, multi-voltage
- SCIL (Scan Configurable Interface Logic) technology for advanced functional testing
JT 2149/DAF (Digital/Analog/Frequency) is a compact, mixed-signal I/O module and is the first unit that offers both digital and analogue test access to PCBs. The DAF module has been designed to slot into regular QuadPod transceiver system used by the JT 37x7 DataBlaster series of controllers. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
JT 2149/DAF is ideal for test systems that require basic functional test measurements (e.g. PSU voltages, clock frequencies etc..). Easy to build into benchtop or rack-mounted functional test systems. Measurements are supported by ProVision plug-in interactive GUIs and/or JFT (Python) control library.
Specification JT 2149/DAF:
- Compact mixed signal measurement module
- Enables direct voltage and frequency measurements on B_S controller
- 16 dual purpose I/O and frequency channels
- Analog voltage measurement on 12 channels
- Programmable clock generator channel
- Powered and hosted by JT 2148 QuadPod
- Volts DC - 12 channels, range 0-32V
- Frequency - 16 channels, range 10-128 MHz, Resolution 8 digits, Accuracy 100 ppm
- Digital I/O - 16 channels (shared with Frequency) variable 1.0 - 3.6 volts
- Generator - 1 channel, range 0.0596Hz-64 MHz, Resolution 59.6 mHz, Accuracy 100 ppm
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JT 2137 POD is a popular TAP port for DataBlaster controller installations within a test fixture. It features four test access pods which together may be set for 5V or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set. The 20-way 0.1" IDC TAP headers comply with the standard JTAG Technologies pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
JT 2137 POD is ideal for siting within test fixtures. Their compact size allowing the TAP signals to be linked via short wires to the test probes. Operating at a maximum TCK of 25 MHz the unit will satisfy most requirements for testing, flash programming and CPLD/FPGA programming in-system.
JT 2137 POD is a low-cost alternative to JT 2147 QuadPod.
Specification JT 2137 POD:
- Four TAP ports with programable threshold at 3.3V or 5V
- 25MHz TCK frequency rated
- Compact size, easy mounting option for fixtures, short wire conections
- Fully Compatible with DataBlasters controllers, connected via SCSI-II or flat cables
- Dimensions 20 x 67 x 105 mm
- Weight 110 g
JT 2147/eDAK is a variant of the JT 2147 QuadPOD signal conditioning interface specifically designed for use within a MAC Panel ‘Scout’ mass interconnect interface. The unit integrates both the basic JT 2148 transceiver plus four independent, programmable JT 2149 TAP’s modules on a single board that matches the MAC Panel Direct Access Kit (DAK) form factor. It’s dedicated to high quality, high-reliability functional test systems for mil/aero, telecoms/datacoms and automotive applications
Specification JT 2147/eDAK:
- Four TAP ports in QuadPod technology
- TCK rated to 40 MHz
- Compatible with JT 37x7/PXI DataBlaster controller
- Simplifies connection and wiring in functional test applications
- Ensures high signal integrity right to the point of test
- Benefits from high degree of RF shielding/noise immunity
- Additional signals for fast flash programming
- Programmable I/O voltages (outputs 1.0V to 3.6V, inputs 0.5V to 1.8V)
- MAC Scout Direct Access Kit form factor
JT 2147/VPC is a variant of the JT 2147 QuadPOD signal conditioning interface specifically designed for use within Virginia Panel Corporation's mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry, two independent, programmable JT 2149 TAP modules and two JT 2149/MPV TAP modules with I/O on a single board that interfaces via the VPC QuadraPaddle connectors type G20x or G14x. It’s dedicated to high quality, high-reliability functional test systems for mil/aero, telecoms/datacoms and automotive applications.
Specification JT 2147/VPC:
- Four TAP ports in QuadPod technology
- TCK rated to 40 MHz
- Compatible with JT 37x7/PXI DataBlaster controller
- Simplifies connection and wiring in functional test applications
- Enhanced signal integrity for high data rates
- Benefits from high degree of RF shielding/noise immunity
- Additional signals for fast flash programming
- Programmable I/O voltages (outputs 1.0V to 3.6V, inputs 0.5V to 1.8V)
- VPC 'Pull-through' system compatible